atg Luther & Maelzer Launches Flying Probe Tester for Substrates

S3 High Speed Substrate Tester for Structures Down to 10 µm
atg Luther & Maelzer has delivered the first flying probe system for substrate test to a major customer in Korea. The S3 10 µm Substrate Tester is the first system of a new atg Luther & Maelzer product line. It meets the challenging requirements of high end substrate test such as positioning accuracy and high number of contact points by applying the advanced flying probe technology of atg Luther & Maelzer. Substrates are used to enable a connection between a semiconductor and a printed circuit board. A characteristic test panel consists of about 50 – 100 single substrates and has a size of approx. 250 mm x 80 mm. For electrical testing it is necessary to contact all end points of the product. Each substrate has about 1000 – 2000 test points. So on one product about 100,000 pads need to be contacted. For testing substrates on the semiconductor side, structure down to 10µm have to be reliably contacted. To meet this challenge the S3 deploys four freely moveable test heads and achieves a test rate of 100 measurements per second. The test heads contact the test product from above and execute a capacitance measurement against a vacuum table. The capacitance result indicates opens and shorts in the substrates. Prior to electrical test, an optical alignment of the test sample correlates the shrinkage and offset of the finished product with the testing data and adjusts automatically. A 5 Megapixel color camera with a resolution of 1.2 µm ensures positioning accuracy of +/- 1.5 µ. The S3 works with a micro needle. The contacting pressure of this micro needle can be adjusted from 0.3 g up to 2.5 g to ensure best test yield and repeatability without damaging the contact pads. The maximum test area of the substrate tester S3 is 310 mm x 300 mm (12.2” x 11.8”). Jochen Kleinertz, vice president PCB Test Group at Xcerra explains: “Today’s established systems work with two test heads and achieve test rates of around 30 measurements per second. With its four test heads architecture the S3 achieves more than three times this speed. We expect that this high throughput capability will enable testing of higher quantities of substrate boards with flying probe test systems in the future. This will provide the customer with an economical test solution for high end substrate boards. After the successful market introduction of the single-sided S3 we plan to complete our new product line with a double-sided system with eight test heads.” The post atg Luther & Maelzer Launches Flying Probe Tester for Substrates appeared first on xcerra.com.

New Flying Probe PCB Tester for Large Format, High Layer-Count

Backplanes: atg Luther & Maelzer releases the A7-20
atg Luther & Maelzer a company of Xcerra Corporation, announces the release and the first installations of the new A7-20 flying probe test system. Specifically designed for the demands of large format, high layer count backplanes, the A7-20 combines the flexibility typical for flying probe testers with accuracy and speed. The A7-20 significantly reduces test time and test cost. The market segment for the A7-20 are large server and back panel designs for the telecommunication industry. These kinds of designs have up to 72 layers with a product weight of up to 30 kg (66 Ibs). 100.000 test points are very common on formats of up to 1.25 m (50 inches). In combination with higher density electrical test comes challenging. Traditional test solutions such as four-head probe systems or multiple oversized test fixtures for grid systems cannot fully meet the requirements in terms of speed and cost. The new A7-20 flying probe system is equipped with 20 test heads, 10 cameras for optical alignment and the latest motion system design with direct linear drive technology for highest accuracy and test speed even on large format. The A7-20 is designed to fully support ease-of-operation and best operator/machine ratio. The horizontal test position provides the advantage that one operator is able to load and unload these heavy printed circuit boards. A moveable support table, which can be attached to the front of the system, is available for loading and unloading. The most comprehensive configuration of the A7 oversized system product line is an A7-24 with 24 test heads and 12 cameras for the optical alignment. A maximum board size up to 1.50 m (60 inches) can be tested at best volume production conditions. Jochen Kleinertz, VP PCB Test Group at Xcerra comments: “We recently delivered and commissioned the first two systems in two large format PCB fabricators in China. With these new flying probe systems, we enable our customers to efficiently meet the increasing demand for high test coverage and 4-wire testing (Kelvin test) also for large PCBs. The unique and industry leading architecture of the atg Luther & Maelzer flying probe product line makes it possible to use a higher number of flying probes per test area and by this to bring down time and cost of test.” The post New Flying Probe PCB Tester for Large Format, High Layer-Count appeared first on xcerra.com.