Leading test solutions for bare boards and substrates
atg Luther & Maelzer will exhibit the new A7-16 flying probe test solution, for oversized boards, as well as, the high speed substrate test solution, S3-8, at the upcoming TPCA Show scheduled to take place October 26 – 28, 2016 at the Nangang Exhibition Center in Taipei, Taiwan.
The A7-169 test system is the optimum solution for high speed and high throughput testing of backpanel and server boards. The A7-16 can be
configured with 16 to 24 test heads and up to 12 cameras for optical alignment. Depending on the number of test heads, the test area is 24” to 39.9” (610 mm x 1000 mm) or 27″ to 59,2″ (670 mm x 1500 mm). The system features the latest direct linear drive technology delivering high accuracy and fast test speed for large format boards. For flexible boards a tension option is available. Please visit http://atg-lm.com/A7-16 for more information.
The S3-8 10µm substrate tester meets the challenging requirements of high end substrate test, which include positioning accuracy and a high number of contact points, by applying the advanced flying probe technology of atg Luther & Maelzer. With its double-sided, eight test heads architecture the S3-8 achieves a substantially higher speed. This high throughput capability enables testing of high quantities of substrate boards using flying probe test systems providing the customer with an economical test solution.
To learn more, please visit http://atg-lm.com/S3-8
For more information, meet company representatives at the show or visit http://atg-lm.com
S3-8 Double Sided High Speed Substrate Tester with 8 Test Heads for Structures Down to 10 µm
atg Luther & Maelzer has added a double sided flying probe system for substrate test to its line of flying probe testers. The S3-8 10 µm substrate tester is the latest model of a new atg Luther & Maelzer product line launched last year with the introduction of the single sided S3. The single sided S3 and the double sided S3-8 both meet the challenging requirements of high end substrate test such as positioning accuracy and high number of contact points by applying the advanced flying probe technology of atg Luther & Maelzer.
Substrates are used to enable a connection between a semiconductor and a printed circuit board. A typical test panel consists of about 50 to 100 single substrates and has a size of approximately 250 mm x 80 mm. Each substrate has about 1000 to 2000 test points requiring about 100,000 pads being contacted to achieve 100% continuity and isolation testing. For testing substrates on semiconductor side, structures as small as 10 µm have to be reliably contacted.
To meet this challenge the S3-8 utilizes eight freely moveable test heads and achieves a test rate of 100 ohmic two-point measurements per second. Optionally the test system can be fitted with a vacuum table for a capacitance based test.
Prior to electrical test, an optical alignment of the test sample correlates the shrinkage and offset of the finished product with the testing data and adjusts automatically. Two 5 Megapixel color cameras with a resolution of 1.2 µm ensure positioning accuracy of +/- 1.5 µ. The S3 systems work with a micro needle with a contacting pressure that is programmable from 0.3 g up to 2.5 g to ensure best test yield and repeatability without damaging the contact pads. The maximum test area of the substrate tester S3-8 is 350 mm x 310 mm (13.8” x 12.2”).
Jochen Kleinertz, vice president PCB Test Group at Xcerra explains: “Today’s established test systems are mostly single sided and therefore do not allow 100% ohmic continuity tests. However, more and more customers are asking for this type of test. The expertise of atg Luther & Maelzer in double sided test systems together with the unique multi head technology makes outstanding accuracy, speed and throughput possible.
We expect that this high throughput capability will enable double sided testing of substrate boards with flying probe test systems despite the high test point counts. This will allow our customers to use new test options for high end substrate boards, which were not available in the past.”
To learn more about the S3-8 Double Sided High Speed Substrate Tester, please visit http://atg-lm.com/S3-8 .
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LM2010 Grid Tester with Optical Alignment
atg Luther & Maelzer’s unique solution for testing large PCB panels with pads down to 150 microns ensures best yield in high volume production. The atg Luther & Maelzer LM2010 with optical alignment combines a well-established grid test system with the state-of-the-art Sniper optical alignment option.
Testing of products with 100-150 micron pads without optical alignment is negatively impacting yields. Pass rates can fall to 50-60% depending on the panel quality. Additionally, the risk of damaging the pads during test increases with smaller pad sizes. While grid test systems designed for testing HDI smartphone PCBs are capable of testing such dense structures, large panel testers do not have the same capability.
The new atg Luther & Melzer Sniper solution with optical alignment is specifically designed for large PCB – like MB motherboards – with dense structures. atg Luther & Maelzer adds the field proven Pico Sniper technology to the LM2010 providing the ability to test panels of up to – 19.2”.
Swen Fleischer, Vice President Greater China at atg-Luther & Maelzer explains: “We developed this solution in close cooperation with our main customers in Asia. It was driven by the trend of motherboard PCB manufacturers to produce two MB motherboards in one production panel. These productions panels with such a dense structure are similar to smartphones or tablet PCBs but with significantly larger dimensions making them more difficult to test. The low first pass rate of standard Grid testers for these types of applications adds cost due to multiple re-testing or the rejection of good PCBs. The LM2010 with Sniper solution can increase the first pass rate of these critical MB panels up to 85% to 95%!”.
The post atg Luther & Maelzer Launches New Solution for Large, High Density PCBs: appeared first on xcerra.com.