http://atg-lm.com/wp-content/uploads/2015/04/ATG_LM_Logo_Tagline_RGB-300x289.jpg 0 0 Daniela Klostermeier http://atg-lm.com/wp-content/uploads/2015/04/ATG_LM_Logo_Tagline_RGB-300x289.jpg Daniela Klostermeier2015-05-19 11:45:442015-06-11 11:51:24Combining Speed with Automation:
http://atg-lm.com/wp-content/uploads/2015/04/ATG_LM_Logo_Tagline_RGB-300x289.jpg 0 0 Daniela Klostermeier http://atg-lm.com/wp-content/uploads/2015/04/ATG_LM_Logo_Tagline_RGB-300x289.jpg Daniela Klostermeier2015-03-26 18:00:312015-06-11 11:52:45atg Luther & Maelzer Launches Flying Probe Tester for Substrates
S3 High Speed Substrate Tester for Structures Down to 10 µmatg Luther & Maelzer has delivered the first flying probe system for substrate test to a major customer in Korea. The S3 10 µm Substrate Tester is the first system of a new atg Luther & Maelzer product line. It meets the challenging requirements of high end substrate test such as positioning accuracy and high number of contact points by applying the advanced flying probe technology of atg Luther & Maelzer. Substrates are used to enable a connection between a semiconductor and a printed circuit board. A characteristic test panel consists of about 50 – 100 single substrates and has a size of approx. 250 mm x 80 mm. For electrical testing it is necessary to contact all end points of the product. Each substrate has about 1000 – 2000 test points. So on one product about 100,000 pads need to be contacted. For testing substrates on the semiconductor side, structure down to 10µm have to be reliably contacted. To meet this challenge the S3 deploys four freely moveable test heads and achieves a test rate of 100 measurements per second. The test heads contact the test product from above and execute a capacitance measurement against a vacuum table. The capacitance result indicates opens and shorts in the substrates. Prior to electrical test, an optical alignment of the test sample correlates the shrinkage and offset of the finished product with the testing data and adjusts automatically. A 5 Megapixel color camera with a resolution of 1.2 µm ensures positioning accuracy of +/- 1.5 µ. The S3 works with a micro needle. The contacting pressure of this micro needle can be adjusted from 0.3 g up to 2.5 g to ensure best test yield and repeatability without damaging the contact pads. The maximum test area of the substrate tester S3 is 310 mm x 300 mm (12.2” x 11.8”). Jochen Kleinertz, vice president PCB Test Group at Xcerra explains: “Today’s established systems work with two test heads and achieve test rates of around 30 measurements per second. With its four test heads architecture the S3 achieves more than three times this speed. We expect that this high throughput capability will enable testing of higher quantities of substrate boards with flying probe test systems in the future. This will provide the customer with an economical test solution for high end substrate boards. After the successful market introduction of the single-sided S3 we plan to complete our new product line with a double-sided system with eight test heads.” The post atg Luther & Maelzer Launches Flying Probe Tester for Substrates appeared first on xcerra.com.
http://atg-lm.com/wp-content/uploads/2015/04/ATG_LM_Logo_Tagline_RGB-300x289.jpg 0 0 Daniela Klostermeier http://atg-lm.com/wp-content/uploads/2015/04/ATG_LM_Logo_Tagline_RGB-300x289.jpg Daniela Klostermeier2015-03-02 17:51:362015-06-11 11:53:13New Flying Probe PCB Tester for Large Format, High Layer-Count
Backplanes: atg Luther & Maelzer releases the A7-20atg Luther & Maelzer a company of Xcerra Corporation, announces the release and the first installations of the new A7-20 flying probe test system. Specifically designed for the demands of large format, high layer count backplanes, the A7-20 combines the flexibility typical for flying probe testers with accuracy and speed. The A7-20 significantly reduces test time and test cost. The market segment for the A7-20 are large server and back panel designs for the telecommunication industry. These kinds of designs have up to 72 layers with a product weight of up to 30 kg (66 Ibs). 100.000 test points are very common on formats of up to 1.25 m (50 inches). In combination with higher density electrical test comes challenging. Traditional test solutions such as four-head probe systems or multiple oversized test fixtures for grid systems cannot fully meet the requirements in terms of speed and cost. The new A7-20 flying probe system is equipped with 20 test heads, 10 cameras for optical alignment and the latest motion system design with direct linear drive technology for highest accuracy and test speed even on large format. The A7-20 is designed to fully support ease-of-operation and best operator/machine ratio. The horizontal test position provides the advantage that one operator is able to load and unload these heavy printed circuit boards. A moveable support table, which can be attached to the front of the system, is available for loading and unloading. The most comprehensive configuration of the A7 oversized system product line is an A7-24 with 24 test heads and 12 cameras for the optical alignment. A maximum board size up to 1.50 m (60 inches) can be tested at best volume production conditions. Jochen Kleinertz, VP PCB Test Group at Xcerra comments: “We recently delivered and commissioned the first two systems in two large format PCB fabricators in China. With these new flying probe systems, we enable our customers to efficiently meet the increasing demand for high test coverage and 4-wire testing (Kelvin test) also for large PCBs. The unique and industry leading architecture of the atg Luther & Maelzer flying probe product line makes it possible to use a higher number of flying probes per test area and by this to bring down time and cost of test.” The post New Flying Probe PCB Tester for Large Format, High Layer-Count appeared first on xcerra.com.
http://atg-lm.com/wp-content/uploads/2015/04/ATG_LM_Logo_Tagline_RGB-300x289.jpg 0 0 Daniela Klostermeier http://atg-lm.com/wp-content/uploads/2015/04/ATG_LM_Logo_Tagline_RGB-300x289.jpg Daniela Klostermeier2015-02-16 18:02:472015-06-11 11:53:46atg Luther & Maelzer to exhibit at IPC APEX Expo 2015
High Performance Flying Probe Test and Automationatg Luther & Maelzer will exhibit its fully automated flying probe test solution at the upcoming IPC APEX Expo scheduled to take place February 24 -26, 2015 at the San Diego Convention Center, California, USA. At IPC APEX Expo, atg Luther & Maelzer will showcase its latest generation automatic flying probe system: The A7 – Automation (A7A). The A7A meets the customer demand for total automation and lights-out operation including processing of different part numbers and product sizes. The A7A has the capability of handling production panelsup to 25” x 21” (635 mm x 535 mm) with an active test area of 24” x 20” (610 mm x 510 mm). The A7A features 8 high-speed carbon fiber test heads in combination with 4 high resolution color cameras. Besides final products, the system can be equipped with tension clamps for testing production panels down to 16 mil (0,4 mm) thickness. The high-speed A7A performs up to 125 measurements per second, depending on the product under test and test method used, on pad sizes as small as 1.3 mil. Learn more about atg Luther & Maelzer at IPC APEX Expo2015 The post atg Luther & Maelzer to exhibit at IPC APEX Expo 2015 appeared first on xcerra.com.
http://atg-lm.com/wp-content/uploads/2015/04/ATG_LM_Logo_Tagline_RGB-300x289.jpg 0 0 Daniela Klostermeier http://atg-lm.com/wp-content/uploads/2015/04/ATG_LM_Logo_Tagline_RGB-300x289.jpg Daniela Klostermeier2014-12-18 13:18:512015-06-11 11:54:23atg Luther & Maelzer releases the A8a
A new generation of automated highs speed flying probe PCB testersThe new A8a test system combines the flexibility of flying probe testers with high throughput. The A8a provides significant cost advantages compared to fixture testers for small and medium batches and fully meets the requirements in its main application field: The electrical test of HDI products for smart phones, tablet and PC motherboards. The A8a ensures best productivity, most efficient operation and best test quality and accuracy. It is equipped with eight test heads and four cameras for optical alignment. The A8a is able to test pad sizes down to 35 micron. Testing HDI products for smart phones, tablet and PC motherboards up to a test area of 18.0” x 12.0” on the A8a, it also eliminates limitations of test point density or fine-pitch contacts. The A8a features embedded component test or a 4-wire Kelvin measurement with an accuracy of +/- 0,025 mΩ. The A8a is provided with a separate good and bad board stacker. The bad boards can be optionally labeled by a 2D-Code. The 2D-code indicates the reference between the boards and the corresponding fault file. This way handling failures by an operator are eliminated. The A8a is prepared for lights out operation. With the feeder capacity of 390 mm it is possible to test 650 boards with a thickness of 0.6 mm at one time. This capacity guarantees an operator-free test over the whole night shift. To fully meet the speed expectations the key feature of the A8a is a new dual shuttle system, which reduces the product exchange time to less than 4 seconds in automation mode. In combination with the fast test speed of up to 140 measurements/second the A8a will give customers a competitive test solution for batches up to 5000 boards. A typical cycle time of a 4-up smart phone board is about 2 minutes. Peter Brandt, Sales Manager Europe and Japan, explains: “The main advantage of the A8a for PCB producers is the significant cost savings compared to a fixture tester. The high costs of dedicated fixtures, which can range from $10-30K per fixture, justify the electrical test with a high speed flying probe system.” The post atg Luther & Maelzer releases the A8a appeared first on xcerra.com.
http://atg-lm.com/wp-content/uploads/2015/04/ATG_LM_Logo_Tagline_RGB-300x289.jpg 0 0 Daniela Klostermeier http://atg-lm.com/wp-content/uploads/2015/04/ATG_LM_Logo_Tagline_RGB-300x289.jpg Daniela Klostermeier2014-11-24 17:34:542015-06-11 11:55:26atg Luther & Maelzer to exhibit at HKPCA Show 2014
Comprehensive Portfolio of Leading Solutions for Bare Board Testatg Luther & Maelzer will exhibit its advanced PCB test solutions at the upcoming HKPCA show, scheduled to take place December 3-5, 2014 at the Shenzhen Convention & Exhibition Centre, Shenzhen, China. At HKPCA, atg Luther & Maelzer will showcase their leading product portfolio of flying probe and universal grid test systems. The comprehensive atg Luther & Maelzer flying probe tester product line provides highly efficient solutions for all kind of bare boards. Automation options and various features to ensure accuracy and uptime make the atg Luther & Maelzer flying probe testers a most reliable choice. atg Luther & Maelzer’s universal grid products are dedicated to high volume test of PCBs under best economic efficiency. A variety of innovative features support leading productivity with advanced automation and alignment tools. The atg Luther & Maelzer LM400 with Sniper offset detection is ready for testing next generation of PCBs with 150 micron pads, which will be introduced on PC motherboards in 2015 The post atg Luther & Maelzer to exhibit at HKPCA Show 2014 appeared first on xcerra.com.
http://atg-lm.com/wp-content/uploads/2015/04/ATG_LM_Logo_Tagline_RGB-300x289.jpg 0 0 Daniela Klostermeier http://atg-lm.com/wp-content/uploads/2015/04/ATG_LM_Logo_Tagline_RGB-300x289.jpg Daniela Klostermeier2014-10-14 16:40:462015-07-07 16:00:25atg Luther & Maelzer to exhibit at TPCA Show 2014