atg Luther & Maelzer to exhibit at CTEX 2017, in Suzhou

New Generation Flying Probe Test and Innovative Grid Test Equipment atg Luther & Maelzer will exhibit its leading test solutions for PCBs at the upcoming CTEX 2017 show scheduled to take place May 17 -19, 2017 at the Suzhou International Expo Center, China. At CTEX 2017 show, atg Luther & Maelzer will showcase its recently launched A8a Automatic Bare Board Flying Probe Test System. The A8a provides the flexibility of flying probe test while delivering high throughput. The A8a is atg Luther & Maelzer’s latest innovation in high performance, high accuracy automatic flying probe testing. The A8a can significantly contribute to the profitability of our customers by combining flexibility, which is typical for flying probe test equipment, with high throughput exceeding capabilities of standard flying probe testers. To learn more about the A8a, please visit http://atg-lm.com/A8a The LM1000, a member of  atg Luther & Maelzer’s leading grid test solutions family, will also be showcased. This dual-technology grid test system has been designed to support the mass production requirements of the HDI market. It supports both cost-efficient universal fixtures and dedicated fixtures for high end applications. Please visit http://atg-lm.com/LM1000 for more details. For more information about atg Luther & Maelzer’s PCB and substrate test solutions, meet company representatives at the show or visit www.atg-LM.com The post atg Luther & Maelzer to exhibit at CTEX 2017, in Suzhou appeared first on xcerra.com.

Combining Flexibility with High Throughput

atg Luther & Maelzer introduced the highly automated A8a Flying Probe Test System atg Luther & Maelzer GmbH introduced its new A8a Automatic Bare Board Flying Probe Test System. The A8a provides the flexibility of flying probe test while delivering high throughput. To achieve high throughput the key feature of the A8a is a new design dual shuttle system, which reduces the product exchange time to zero seconds. In addition to superior test speed of up to 140 measurements per second the A8a provides innovative load /unload and pass / fail sorting for true automatic „lights-out“ operation. Typical features such as high accuracy Kelvin 4 wire, embedded component and latent defect test are available as well as a tension clamp set up for flexible products. atg Luther & Maelzer Sales Director for Europe and responsible product manager, Peter Brandt, highlights: “The A8a is atg-LM’s latest innovation in high performance, high accuracy automatic flying probe testing. The A8a can significantly contribute to the profitability of our customers by combining widest flexibility with high throughput. To learn more about the A8a, please visit http://atg-lm.com/A8a The post Combining Flexibility with High Throughput appeared first on xcerra.com.

atg Luther & Maelzer to introduce the highly automated A8a Flying Probe Test System at IPC APEX 2017

atg Luther & Maelzer GmbH will introduce its new A8a Automatic Bare Board Flying Probe Test System at IPC APEX EXPO 2017, which is scheduled to take place on February 14 – February 16, 2017 at the Convention Center in San Diego CA. atg Luther & Maelzer North American Sales Director, Klaus Koziol, highlights: “The A8a is atg-LM’s latest innovation in high performance, high accuracy automatic flying probe testing. The A8a provides the flexibility of flying probe test while delivering high throughput. “ To achieve high throughput the key features of the A8a is a new design dual shuttle system which reduces the product exchange time to zero seconds. In addition to superior test speed of up to 140 measurements per second the A8a provides innovative load /unload and pass / fail sorting for true automatic „lights-out“ operation. Typical features such as high accuracy Kelvin 4 wire, embedded component and latent defect test are available as well as a tension clamp set up for flexible products. To learn more about the A8a, please visit http://atg-lm.com/A8a The post atg Luther & Maelzer to introduce the highly automated A8a Flying Probe Test System at IPC APEX 2017 appeared first on xcerra.com.

atg Luther & Maelzer to exhibit at TPCA Show 2016

Leading test solutions for bare boards and substrates

atg Luther & Maelzer will exhibit the new A7-16 flying probe test solution, for oversized boards, as well as, the high speed substrate test solution, S3-8, at the upcoming TPCA Show scheduled to take place October 26 – 28, 2016 at the Nangang Exhibition Center in Taipei, Taiwan.

The A7-169 test system is the optimum solution for high speed and high throughput testing of backpanel and server boards. The A7-16 can be

configured with 16 to 24 test heads and up to 12 cameras for optical alignment. Depending on the number of test heads, the test area is 24” to 39.9” (610 mm x 1000 mm) or 27″ to 59,2″ (670 mm x 1500 mm). The system features the latest direct linear drive technology delivering high accuracy and fast test speed for large format boards. For flexible boards a tension option is available. Please visit http://atg-lm.com/A7-16 for more information.

The S3-8 10µm substrate tester meets the challenging requirements of high end substrate test, which include positioning accuracy and a high number of contact points, by applying the advanced flying probe technology of atg Luther & Maelzer. With its double-sided, eight test heads architecture the S3-8 achieves a substantially higher speed. This high throughput capability enables testing of high quantities of substrate boards using flying probe test systems providing the customer with an economical test solution.

To learn more, please visit http://atg-lm.com/S3-8

For more information, meet company representatives at the show or visit http://atg-lm.com

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atg Luther & Maelzer to exhibit at CTEX 2016, in Suzhou

High Precision Flying Probe Test and Innovative Grid Test Equipment atg Luther & Maelzer will exhibit its leading test solutions for PCBs and substrates at the upcoming CTEX 2016 show scheduled to take place May 18 -20, 2016 at the Suzhou International Expo Center, China. At CTEX 2016 show, atg Luther & Maelzer will showcase its recently launched grid test solution, the LM1000. This dual-technology grid test system has been designed to support the mass production requirements of the HDI market. It supports both cost-efficient universal fixtures and dedicated fixtures for high end applications. From the market leading flying probe product family, atg Luther & Maelzer will exhibit the recently launched S3 Tester. The S3 Flying Probe tester is capable of contacting 10µm substrate and meets all challenging requirements of high end substrate test. These requirements include positioning accuracy and a high number of contact points. This has been accomplished by leveraging the advanced flying probe technology of atg Luther & Maelzer. For more information, meet company representatives at the show or visit http://atg-lm.com/

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atg Luther & Maelzer to exhibit at IPC APEX Expo 2016

High Performance Flying Probe Test and Automation              At IPC APEX Expo, atg Luther & Maelzer will showcase its bestselling automatic flying probe system: The A7 – Automation (A7a). The A7a combines advanced levels of automation with highest flexibility for handling shipment panels, as well as, big production panels. The A7a meets the customer demand for full automation and lights-out operation including processing of different part numbers and product sizes. It has the capability of handling production panels up to 25” x 21” (635 mm x 535 mm) with an active test area of 24” x 20” (610 mm x 510 mm). The A7a features 8 high-speed carbon fiber test heads in combination with 4 high resolution color cameras. Besides final products, the system can be equipped with tension clamps for testing production panels down to 16 mil (0.4 mm) thickness. The high-speed A7a performs up to 125 measurements per second, depending on the product under test and test method used, on pad sizes as small as 1.3 mil.” For more information, meet company representatives at the show or visit http://atg-lm.com/A7a

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NEW Double Sided Flying Probe Tester for Substrate Test from atg Luther & Maelzer

S3-8 Double Sided High Speed Substrate Tester with 8 Test Heads for Structures Down to 10 µm             

atg Luther & Maelzer has added a double sided flying probe system for substrate test to its line of flying probe testers. The S3-8 10 µm substrate tester is the latest model of a new atg Luther & Maelzer product line launched last year with the introduction of the single sided S3. The single sided S3 and the double sided S3-8 both meet the challenging requirements of high end substrate test such as positioning accuracy and high number of contact points by applying the advanced flying probe technology of atg Luther & Maelzer.

Substrates are used to enable a connection between a semiconductor and a printed circuit board. A typical test panel consists of about 50 to 100 single substrates and has a size of approximately 250 mm x 80 mm. Each substrate has about 1000 to 2000 test points  requiring about 100,000 pads being contacted to achieve 100% continuity and isolation testing. For testing substrates on semiconductor side, structures as small as 10 µm have to be reliably contacted.

To meet this challenge the S3-8 utilizes eight freely moveable test heads and achieves a test rate of 100 ohmic two-point measurements per second. Optionally the test system can be fitted with a vacuum table for a capacitance based test.

Prior to electrical test, an optical alignment of the test sample correlates the shrinkage and offset of the finished product with the testing data and adjusts automatically. Two 5 Megapixel color cameras with a resolution of 1.2 µm ensure positioning accuracy of +/- 1.5 µ. The S3 systems work with a micro needle with a contacting pressure that is programmable from 0.3 g up to 2.5 g to ensure best test yield and repeatability without damaging the contact pads. The maximum test area of the substrate tester S3-8 is 350 mm x 310 mm (13.8” x 12.2”).

Jochen Kleinertz, vice president PCB Test Group at Xcerra explains: “Today’s established test systems are mostly single sided and therefore do not allow 100% ohmic continuity tests. However, more and more customers are asking for this type of test. The expertise of atg Luther & Maelzer in double sided test systems together with the unique multi head technology makes outstanding accuracy, speed and throughput possible.

We expect that this high throughput capability will enable double sided testing of substrate boards with flying probe test systems despite the high test point counts. This will allow our customers to use new test options for high end substrate boards, which were not available in the past.”

To learn more about the S3-8 Double Sided High Speed Substrate Tester, please visit http://atg-lm.com/S3-8 .

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