High Precision Flying Probe Test and Production Proven Grid Test Equipment
atg Luther & Maelzer will exhibit its leading test solutions for PCBs and substrates at the upcoming International Printed Circuit & APEX South China Fair scheduled to take place December 2-4, 2015 at the Shenzhen Convention & Exhibition Center, China.
atg Luther & Maelzer will showcase its well established grid test solutions LM2010 combined with the proven optical alignment system “Sniper” for the test of motherboards with pads sizes down to 150 µm.
From the leading flying probe product family, atg Luther & Maelzer will exhibit the recently launched S3 Tester. The S3 Flying Probe tester is capable to contact 10 µm Substrate and meets all challenging requirements of high end substrate test. Such as positioning accuracy and high number of contact points by applying the advanced flying probe technology of atg Luther & Maelzer.
For more information, meet company representatives at the show or visit www.atg-LM.com.