atg Luther & Maelzer to exhibit at TPCA Show 2017

Leading test solutions for bare boards and substrates

atg Luther & Maelzer will exhibit the new A8a flying probe test solution as well as, the high speed substrate test solution, S3-8, at the upcoming TPCA Show scheduled to take place October 25 – 27, 2017 at the Nangang Exhibition Center in Taipei, Taiwan.

Read more

atg Luther & Maelzer to exhibit at CTEX 2017, in Suzhou

New Generation Flying Probe Test and Innovative Grid Test Equipment

atg Luther & Maelzer will exhibit its leading test solutions for PCBs at the upcoming CTEX 2017 show scheduled to take place May 17 -19, 2017 at the Suzhou International Expo Center, China.

Read more

Combining Flexibility with High Throughput

atg Luther & Maelzer introduced the highly automated A8a Flying Probe Test System

atg Luther & Maelzer GmbH introduced its new A8a Automatic Bare Board Flying Probe Test System. The A8a provides the flexibility of flying probe test while delivering high throughput.

Read more

atg Luther & Maelzer to introduce the highly automated A8a Flying Probe Test System at IPC APEX 2017

atg Luther & Maelzer GmbH will introduce its new A8a Automatic Bare Board Flying Probe Test System at IPC APEX EXPO 2017, which is scheduled to take place on February 14 – February 16, 2017 at the Convention Center in San Diego CA.

Read more

atg Luther & Maelzer to exhibit at TPCA Show 2016

Leading test solutions for bare boards and substrates

atg Luther & Maelzer will exhibit the new A7-16 flying probe test solution, for oversized boards, as well as, the high speed substrate test solution, S3-8, at the upcoming TPCA Show scheduled to take place October 26 – 28, 2016 at the Nangang Exhibition Center in Taipei, Taiwan.

Read more

atg Luther & Maelzer to exhibit at CTEX 2016, in Suzhou

High Precision Flying Probe Test and Innovative Grid Test Equipment

atg Luther & Maelzer will exhibit its leading test solutions for PCBs and substrates at the upcoming CTEX 2016 show scheduled to take place May 18 -20, 2016 at the Suzhou International Expo Center, China.

Read more

atg Luther & Maelzer to exhibit at IPC APEX Expo 2016

High Performance Flying Probe Test and Automation

At IPC APEX Expo, atg Luther & Maelzer will showcase its bestselling automatic flying probe system: The A7 – Automation (A7a). The A7a combines advanced levels of automation with highest flexibility for handling shipment panels, as well as, big production panels.

Read more

NEW Double Sided Flying Probe Tester for Substrate Test from atg Luther & Maelzer

S3-8 Double Sided High Speed Substrate Tester with 8 Test Heads for Structures Down to 10  µm                    

atg Luther & Maelzer has added a double sided flying probe system for substrate test to its line of flying probe testers. The S3-8 10  µm substrate tester is the latest model of a new atg Luther & Maelzer product line launched last year with the introduction of the single sided S3. The single sided S3 and the double sided S3-8 both meet the challenging requirements of high end substrate test such as positioning accuracy and high number of contact points by applying the advanced flying probe technology of atg Luther & Maelzer.

Read more

atg Luther & Maelzer Launches New Solution for Large, High Density PCBs:

LM2010 Grid Tester with Optical Alignment

atg Luther & Maelzer’s unique solution for testing large PCB panels with pads down to 150 microns ensures best yield in high volume production. The atg Luther & Maelzer LM2010 with optical alignment combines a well-established grid test system with the state-of-the-art Sniper optical alignment option.

Read more

atg Luther & Maelzer to exhibit at International Printed Circuit & APEX South China Fair, in Shenzhen

High Precision Flying Probe Test and Production Proven Grid Test Equipment

atg Luther & Maelzer will exhibit its leading test solutions for PCBs and substrates at the upcoming International Printed Circuit & APEX South China Fair scheduled to take place December 2-4, 2015 at the Shenzhen Convention & Exhibition Center, China.

Read more