Our offering ranges from Flying Probe based test systems (FPT) to fixture based Grid test systems. atg’s Flying Probe Systems use direct (ohmic) and indirect (capacitance, inductance) measurement techniques and offer many options for using both in combination in order to achieve the best reliability / performance ratio. In addition, a wide range of measurement methods like Micro-Short Detection®,   4-Wire Test (Kelvin Test), embedded component test and LaTest® (Latent Defect Test) is available to cater to specific application requirements. Also the Grid systems offer many different possibilities like Micro Short Detection®,   4-Wire Test (Kelvin Test) and Spark-Test for optimal test Solutions.

Next to applications in the bare board industry, we are also offering solutions for Wafer and Touch Panel testing.

With subsidiaries in the USA, China Mainland and Taiwan and an international network of partners, we are close to our customer wherever he operates. The network is designed to be highly responsive to customer needs regardless of location or time.