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S2 plus Flying Probe Substrate Test

Double Sided Tester for Substrate and HDI Boards

Key Features

  • 8 Test Heads
  • Fast Dual Shuttle System
  • High-speed direct linear drives for X and Z motion
  • No Probe Marks
  • 15  µm pad size and 30  µm pitch
  • 4 high-resolution cameras for fast optical scanning of top and bottom side
  • Fast 300 mA Kelvin testing
  • Test area 24″ x 12.2″ (610 mm x 310 mm)
S2 plus

  • Test Heads
  • 8 (4 top/4 bottom)
  • Test Area
  • 24.0″ x 12.2″
    (610 mm x 310 mm)
  • Application
  • Double Sided
  • Smallest Pad Size
  • 25  µm (1.4 mil)*
    35  µm (1.4 mil)**
  • Smallest Pitch Size
  • 50  µm (2.0 mil)*
    75  µm (3.0 mil)**

*using max. text area 11.8″ x 12.2″

**using max test area 24.0″ x 12.2″

The S-line is characterized by an outstanding test head technology. Linear motor drives in combination with ceramic air bearing gives the S2-8 plus and S2-16 plus the highest speed and accuracy. The testers are equipped with a dual shuttle system. One shuttle can be unload and load while the board in the second shuttle is tested, maximizing machine utilization.

© atg Luther & Maelzer 2021
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