• key-visual_website-1

Flying Probe Substrate Test Systems

atg Luther & Maelzer offers Flying Probe Substrate Test Systems with structures down to 10  µm and several hundred thousand test points per panel require specific solutions for scanning, capacitance measurement, and high accuracy and temperature management. We offer manual test systems where the loading and unloading is done manually and automated test systems which are suitable for lights out operation.

S2 plus

S2 plus

Double Sided Test

  • 8 Test Heads
  • 15  µm pad size and 30  µm pitch
  • Test area 24″ x 12.2″ (610 mm x 310 mm)
S2-16 plus

S2-16 plus

Double Sided Test

  • 16 Test Heads
  • 15  µm pad size and 35  µm pitch
  • Test area 24″ x 24.4″ (610 mm x 620 mm)
S3

S3

Single Sided Test

  • 4 Test Heads
  • 10  µm pad size and 25  µm pitch
  • Test area 11.8″ x 12.2″ (300 mm x 310 mm)
S3-8

S3-8

Double Sided Test

  • 8 Test Heads
  • 10  µm pad size and 25  µm pitch
  • Test area 13.8″ x 12.2″ (350 mm x 310 mm)

© atg Luther & Maelzer 2021
This website is using Google Analytics. Please click here if you want to opt-out. Click here to opt-out For opting out with your mobile device, please refer to our Privacy Statement